Dielectric properties of thin insulating layers measured by Electrostatic Force MicroscopyC. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, G. A. Schwartz, D. G. de Oteyza, A. Alegría and J. ColmeneroEur. Phys. J. Appl. Phys., 50 1 (2010) 10501DOI: https://doi.org/10.1051/epjap/2010010
