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Cited article:

Monte Carlo simulation of ion-induced secondary electron emission from MgO film

S. Ullah, A. H. Dogar, A. Qayyum

Eur. Phys. J. Appl. Phys., 44 3 (2008) 235-239

Published online: 2008-12-06

DOI: https://doi.org/10.1051/epjap:2008174

This article has been cited by the following article(s):

Ion-induced secondary electron emission from ZnS thin films deposited by closed-spaced sublimation

M. Ashraf, S. Ullah, S. Hussain, A.H. Dogar and A. Qayyum
Applied Surface Science 258 (1) 176 (2011)
DOI: 10.1016/j.apsusc.2011.08.026
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Monte Carlo study of the ion-induced electron current tunneling through a metal–insulator–metal junction

S. Ullah, A.H. Dogar, S. Hussain and A. Qayyum
Thin Solid Films 519 (16) 5486 (2011)
DOI: 10.1016/j.tsf.2011.03.047
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Monte Carlo study of ion-induced secondary electron emission from SiO2

Shakir Ullah, A.H. Dogar and A. Qayyum
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 (18) 3059 (2009)
DOI: 10.1016/j.nimb.2009.06.077
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Ion-induced kinetic electron emission from 6 LiF, 7 LiF and MgF 2 thin films

S Ullah, A. H Dogar, M Ashraf and A Qayyum
Chinese Physics B 19 (8) 083401 (2010)
DOI: 10.1088/1674-1056/19/8/083401
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