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Cited article:

Electrostatic displacement of multiwalled carbon nanotubes by scanning a voltage-applied tip of an atomic force microscope

D.-H. Kim, J.-Y. Koo, J.-J. Kim

Eur. Phys. J. Appl. Phys., 28 3 (2004) 301-304

Published online: 2004-11-23

DOI: https://doi.org/10.1051/epjap:2004199

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