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Exact polynomial inversion for top transparent layer parameters on an arbitrary substrate in ellipsometry

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Journal of Physics: Condensed Matter 20 (28) 285225 (2008)
DOI: 10.1088/0953-8984/20/28/285225
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Deposition of Ge-doped silica thin films for an integrated optic application using a matrix distributed electron cyclotron resonance PECVD reactor

Roelene Botha, Pavel V. Bulkin and Pieter L. Swart
Optical Materials 30 (2) 244 (2007)
DOI: 10.1016/j.optmat.2006.11.055
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Multilayer optical filters control by multi-channel kinetic ellipsometry

B. Haj Ibrahim, R. Botha, P. Bulkin and B. Drévillon
physica status solidi (c) 5 (5) 1290 (2008)
DOI: 10.1002/pssc.200777819
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