Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Characterization of Nanocavities in Silicon Using Small Angle X-Ray Scattering

Myriam Dunmont, Vanessa Coulet, Gabrielle Regula and Françoise Bley
MRS Proceedings 994 0994-F06-02 (2007)
DOI: 10.1557/PROC-0994-F06-02
See this article

Physical Chemistry of Semiconductor Materials and Processes

Physical Chemistry of Semiconductor Materials and Processes 195 (2015)
DOI: 10.1002/9781118514610.ch3
See this article