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Cited article:

Raman investigation of stress and phase transformation induced in silicon by indentation at high temperatures

S. Kouteva-Arguirova, V. Orlov, W. Seifert, J. Reif, H. Richter

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 279-283

Published online: 2004-07-15

DOI: https://doi.org/10.1051/epjap:2004144

This article has been cited by the following article(s):

Investigation of cracking in monocrystalline silicon induced by high- temperature indentation

Zerui Zhao, Shuilong Zhou, Xianke Li, Bo Zhu, Shanyue Guan, Shunbo Wang and Hongwei Zhao
Engineering Failure Analysis 159 108113 (2024)
https://doi.org/10.1016/j.engfailanal.2024.108113

Raman Imaging

G. Gouadec, L. Bellot-Gurlet, D. Baron and Ph. Colomban
Springer Series in Optical Sciences, Raman Imaging 168 85 (2012)
https://doi.org/10.1007/978-3-642-28252-2_3