Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy

M. Serenyi, T. Lohner, P. Petrik and C. Frigeri
Thin Solid Films 515 (7-8) 3559 (2007)
DOI: 10.1016/j.tsf.2006.10.137
See this article