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Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD-PICTS) and microwave detected photoconductivity (MDP)

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Non Destructive Electrical Defect Characterisation and Topography of Silicon Wafers and Epitaxial Layers

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Contact Free Defect Investigation in as grown Fe-doped SI-InP

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MRS Proceedings 864 (2005)
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Contact-free defect investigation of wafer-annealed Fe-doped SI-InP

S. Hahn, K. Dornich, T. Hahn, A. Köhler and J.R. Niklas
Materials Science in Semiconductor Processing 9 (1-3) 355 (2006)
DOI: 10.1016/j.mssp.2006.01.077
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Explanation of positive and negative PICTS peaks in SI-GaAs

S. Schmerler, T. Hahn, S. Hahn, J. R. Niklas and B. Gründig-Wendrock
Journal of Materials Science: Materials in Electronics 19 (S1) 328 (2008)
DOI: 10.1007/s10854-007-9564-2
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