Articles citing this article

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Cited article:

Contactless electrical defect characterization in semiconductors by microwave detected photo induced current transient spectroscopy (MD‐PICTS) and microwave detected photoconductivity (MDP)

Bastian Berger, Nadine Schüler, Sabrina Anger, Bianca Gründig‐Wendrock, Jürgen R. Niklas and Kay Dornich
physica status solidi (a) 208 (4) 769 (2011)
https://doi.org/10.1002/pssa.201083994

Explanation of positive and negative PICTS peaks in SI-GaAs

S. Schmerler, T. Hahn, S. Hahn, J. R. Niklas and B. Gründig-Wendrock
Journal of Materials Science: Materials in Electronics 19 (S1) 328 (2008)
https://doi.org/10.1007/s10854-007-9564-2

Contact-free defect investigation of wafer-annealed Fe-doped SI-InP

S. Hahn, K. Dornich, T. Hahn, A. Köhler and J.R. Niklas
Materials Science in Semiconductor Processing 9 (1-3) 355 (2006)
https://doi.org/10.1016/j.mssp.2006.01.077

Non Destructive Electrical Defect Characterisation and Topography of Silicon Wafers and Epitaxial Layers

K. Dornich, T. Hahn and J.R. Niklas
MRS Proceedings 864 (2005)
https://doi.org/10.1557/PROC-864-E11.2