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Cited article:

Determination of localized trap parameters in organic semiconductors using charge based deep level transient spectroscopy (Q-DLTS)

T. P. Nguyen, J. Ip, O. Gaudin, R. B. Jackman

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 219-222

Published online: 2004-07-15

DOI: https://doi.org/10.1051/epjap:2004079

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