Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Study of thin layer materials presenting interfaces using white light interference measurements

R. Meyer, F. Stock, C. Cordier, J. Schiffler, P. Montgomery, M. Flury and F. Antoni
Optics & Laser Technology 184 112444 (2025)
https://doi.org/10.1016/j.optlastec.2025.112444

Handbook of Full-Field Optical Coherence Microscopy

P. C. Montgomery, F. Anstotz, D. Montaner and F. Salzenstein
Handbook of Full-Field Optical Coherence Microscopy 393 (2016)
https://doi.org/10.1201/9781315364889-12

Corrosion behavior of each phase in low carbon microalloyed ferrite–bainite dual-phase steel: Experiments and modeling

Shaopeng Qu, Xiaolu Pang, Yanbin Wang and Kewei Gao
Corrosion Science 75 67 (2013)
https://doi.org/10.1016/j.corsci.2013.05.017

Towards real time 3D quantitative characterisation ofin situlayer growth using white light interference microscopy

P C Montgomery, F Anstotz, J Montagna, et al.
Journal of Physics: Conference Series 253 012017 (2010)
https://doi.org/10.1088/1742-6596/253/1/012017

Real time surface morphology analysis of semiconductor materials and devices using 4D interference microscopy

Paul Montgomery, Freddy Anstotz, Gyasi Johnson and Renaud Kiefer
Journal of Materials Science: Materials in Electronics 19 (S1) 194 (2008)
https://doi.org/10.1007/s10854-007-9491-2