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Cited article:

Impact of ultra-thinning on DC characteristics of MOSFET devices

S. Pinel, F. Lépinois, A. Cazarré, J. Tasselli, A. Marty, J. P. Bailbé

Eur. Phys. J. AP, 17 1 (2002) 41-43

Published online: 2002-01-15

DOI: https://doi.org/10.1051/epjap:2001011

This article has been cited by the following article(s):

Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's

C. Lochot, J.P. Lainé, M. Bafleur, A. Cazarré and J. Tasselli
Microelectronics Journal 37 (8) 804 (2006)
DOI: 10.1016/j.mejo.2005.10.016
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H. L. Kao, Y. C. Chang, B. S. Lin, M. H. Huang and C. H. Kao
1 (2008)
DOI: 10.1109/ICCDCS.2008.4542621
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