Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

Low-temperature fabrication technologies of Si solar cell by sputter epitaxy method

Sohei Fujimura, Takahiro Someya, Shuhei Yoshiba, et al.
Japanese Journal of Applied Physics 54 (8S1) 08KD01 (2015)
DOI: 10.7567/JJAP.54.08KD01
See this article

How lifetime fluctuations, grain-boundary recombination, and junctions affect lifetime measurements and their correlation to silicon solar cell performance

Wyatt K. Metzger
Solar Energy Materials and Solar Cells 92 (9) 1123 (2008)
DOI: 10.1016/j.solmat.2008.04.001
See this article

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

O. Palais, E. Yakimov and S. Martinuzzi
Materials Science and Engineering: B 91-92 216 (2002)
DOI: 10.1016/S0921-5107(01)00998-9
See this article

Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells

Gregory M. Berman, Nathan J. Call, Richard K. Ahrenkiel and Steven W. Johnston
MRS Proceedings 1123 (2008)
DOI: 10.1557/PROC-1123-1123-P03-08
See this article

Characterization of multicrystalline silicon wafers by non-invasive measurements

M. Kunst and P. Grunow
Solar Energy Materials and Solar Cells 83 (4) 409 (2004)
DOI: 10.1016/j.solmat.2004.01.034
See this article

Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps

P Hidalgo, O Palais and S Martinuzzi
Journal of Physics: Condensed Matter 16 (2) S19 (2004)
DOI: 10.1088/0953-8984/16/2/003
See this article

Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

S. Martinuzzi, O. Palais and S. Ostapenko
Materials Science in Semiconductor Processing 9 (1-3) 230 (2006)
DOI: 10.1016/j.mssp.2006.01.079
See this article

Computer simulation of excess carrier distribution for the phase shift microwave detected photoconductivity technique

V.V. Sirotkin and E.B. Yakimov
Materials Science and Engineering: B 91-92 253 (2002)
DOI: 10.1016/S0921-5107(01)01022-4
See this article

N-type multicrystalline silicon wafers and rear junction solar cells

S. Martinuzzi, O. Palais, M. Pasquinelli and F. Ferrazza
The European Physical Journal Applied Physics 32 (3) 187 (2005)
DOI: 10.1051/epjap:2005085
See this article

Segregation phenomena in large-size cast multicrystalline Si ingots

S. Martinuzzi, I. Périchaud and O. Palais
Solar Energy Materials and Solar Cells 91 (13) 1172 (2007)
DOI: 10.1016/j.solmat.2007.03.026
See this article

Minority carrier bulk lifetimes through a large multicrystalline silicon ingot and related solar cell properties

S. Martinuzzi, M. Gauthier, D. Barakel, et al.
The European Physical Journal Applied Physics 40 (1) 83 (2007)
DOI: 10.1051/epjap:2007130
See this article

Improvement in Surface Grinding Damage in Silicon Wafers by Chemical Spin Etching

Kei Kinoshita
ECS Journal of Solid State Science and Technology 3 (4) Q61 (2014)
DOI: 10.1149/2.022404jss
See this article

Gold Diffusion as a Tool for Defect Characterization in Si

Olga V. Feklisova and Eugene B. Yakimov
Solid State Phenomena 95-96 495 (2003)
DOI: 10.4028/www.scientific.net/SSP.95-96.495
See this article

From EBIC images to qualitative minority carrier diffusion length maps

O. Marcelot and P. Magnan
Ultramicroscopy 197 23 (2019)
DOI: 10.1016/j.ultramic.2018.11.005
See this article

Relationship between structure, segregation and electrical activity in grain boundaries

A. Lamzatouar, O. Palais, O. B. M. Hardouin Duparc, J. Thibault and A. Charaï
Journal of Materials Science 40 (12) 3163 (2005)
DOI: 10.1007/s10853-005-2679-z
See this article