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Cited article:
O. Palais, J. Gervais, E. Yakimov, S. Martinuzzi
Eur. Phys. J. AP, 10 2 (2000) 157-162
Published online: 2000-05-15
This article has been cited by the following article(s):
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How lifetime fluctuations, grain-boundary recombination, and junctions affect lifetime measurements and their correlation to silicon solar cell performance
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Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers
O. Palais, E. Yakimov and S. Martinuzzi
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Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells
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Characterization of multicrystalline silicon wafers by non-invasive measurements
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Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps
P Hidalgo, O Palais and S Martinuzzi
Journal of Physics: Condensed Matter 16 (2) S19 (2004)
DOI: 10.1088/0953-8984/16/2/003
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Scanning techniques applied to the characterisation of P and N type multicrystalline silicon
S. Martinuzzi, O. Palais and S. Ostapenko
Materials Science in Semiconductor Processing 9 (1-3) 230 (2006)
DOI: 10.1016/j.mssp.2006.01.079
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Computer simulation of excess carrier distribution for the phase shift microwave detected photoconductivity technique
V.V. Sirotkin and E.B. Yakimov
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N-type multicrystalline silicon wafers and rear junction solar cells
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Segregation phenomena in large-size cast multicrystalline Si ingots
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DOI: 10.1016/j.solmat.2007.03.026
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Minority carrier bulk lifetimes through a large multicrystalline silicon ingot and related solar cell properties
S. Martinuzzi, M. Gauthier, D. Barakel, et al.
The European Physical Journal Applied Physics 40 (1) 83 (2007)
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Improvement in Surface Grinding Damage in Silicon Wafers by Chemical Spin Etching
Kei Kinoshita
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Gold Diffusion as a Tool for Defect Characterization in Si
Olga V. Feklisova and Eugene B. Yakimov
Solid State Phenomena 95-96 495 (2003)
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From EBIC images to qualitative minority carrier diffusion length maps
O. Marcelot and P. Magnan
Ultramicroscopy 197 23 (2019)
DOI: 10.1016/j.ultramic.2018.11.005
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Relationship between structure, segregation and electrical activity in grain boundaries
A. Lamzatouar, O. Palais, O. B. M. Hardouin Duparc, J. Thibault and A. Charaï
Journal of Materials Science 40 (12) 3163 (2005)
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