Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Low-temperature fabrication technologies of Si solar cell by sputter epitaxy method

Sohei Fujimura, Takahiro Someya, Shuhei Yoshiba, et al.
Japanese Journal of Applied Physics 54 (8S1) 08KD01 (2015)
https://doi.org/10.7567/JJAP.54.08KD01

Improvement in Surface Grinding Damage in Silicon Wafers by Chemical Spin Etching

Kei Kinoshita
ECS Journal of Solid State Science and Technology 3 (4) Q61 (2014)
https://doi.org/10.1149/2.022404jss

How lifetime fluctuations, grain-boundary recombination, and junctions affect lifetime measurements and their correlation to silicon solar cell performance

Wyatt K. Metzger
Solar Energy Materials and Solar Cells 92 (9) 1123 (2008)
https://doi.org/10.1016/j.solmat.2008.04.001

Evaluation of Four Imaging Techniques for the Electrical Characterization of Solar Cells

Gregory M. Berman, Nathan J. Call, Richard K. Ahrenkiel and Steven W. Johnston
MRS Proceedings 1123 (2008)
https://doi.org/10.1557/PROC-1123-1123-P03-08

Minority carrier bulk lifetimes through a large multicrystalline silicon ingot and related solar cell properties

S. Martinuzzi, M. Gauthier, D. Barakel, et al.
The European Physical Journal Applied Physics 40 (1) 83 (2007)
https://doi.org/10.1051/epjap:2007130

Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

S. Martinuzzi, O. Palais and S. Ostapenko
Materials Science in Semiconductor Processing 9 (1-3) 230 (2006)
https://doi.org/10.1016/j.mssp.2006.01.079

N-type multicrystalline silicon wafers and rear junction solar cells

S. Martinuzzi, O. Palais, M. Pasquinelli and F. Ferrazza
The European Physical Journal Applied Physics 32 (3) 187 (2005)
https://doi.org/10.1051/epjap:2005085

Relationship between structure, segregation and electrical activity in grain boundaries

A. Lamzatouar, O. Palais, O. B. M. Hardouin Duparc, J. Thibault and A. Charaï
Journal of Materials Science 40 (12) 3163 (2005)
https://doi.org/10.1007/s10853-005-2679-z

Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps

P Hidalgo, O Palais and S Martinuzzi
Journal of Physics: Condensed Matter 16 (2) S19 (2004)
https://doi.org/10.1088/0953-8984/16/2/003

Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers

O. Palais, E. Yakimov and S. Martinuzzi
Materials Science and Engineering: B 91-92 216 (2002)
https://doi.org/10.1016/S0921-5107(01)00998-9

Computer simulation of excess carrier distribution for the phase shift microwave detected photoconductivity technique

V.V. Sirotkin and E.B. Yakimov
Materials Science and Engineering: B 91-92 253 (2002)
https://doi.org/10.1016/S0921-5107(01)01022-4