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This article has been cited by the following article(s):

Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study

D. Pastré and M. Troyon
Journal of Applied Physics 86 (8) 4326 (1999)
DOI: 10.1063/1.371365
See this article

Resolution in scanning near-field cathodoluminescence microscopy

D. Pastré, J. L. Bubendorff and M. Troyon
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 18 (3) 1138 (2000)
DOI: 10.1116/1.591349
See this article