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Cited article:

I−V characteristics of co-planar metal-semiconductor-metal nanojunctions

V. Rousset, C. Joachim, T. Ondarçuhu, B. Rousset

Eur. Phys. J. AP, 3 1 (1998) 21-28

Published online: 1998-07-15

DOI: https://doi.org/10.1051/epjap:1998199

PDF (316.1 KB)

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A metallic microcantilever electric contact probe array incorporated in an atomic force microscope

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Combing a carbon nanotube on a flat metal-insulator-metal nanojunction

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