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Cited article:

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Order and disorder at the atomic scale: Microscopy applied to semiconductors

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Reviews of Modern Physics 97 (2) (2025)
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Mesoscopic modeling of field evaporation on atom probe tomography

Constantinos Hatzoglou, Benjamin Klaes, Fabien Delaroche, Gérald Da Costa, Brian Geiser, Markus Kühbach, Peter B Wells and François Vurpillot
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Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography

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Microscopy and Microanalysis 29 (3) 1124 (2023)
https://doi.org/10.1093/micmic/ozad054

Automated calibration of model-driven reconstructions in atom probe tomography

Charles Fletcher, Michael P Moody, Claudia Fleischmann, et al.
Journal of Physics D: Applied Physics 55 (37) 375301 (2022)
https://doi.org/10.1088/1361-6463/ac7986

Compensating Local Magnifications in Atom Probe Tomography for Accurate Analysis of Nano-Sized Precipitates

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Microscopy and Microanalysis 27 (3) 499 (2021)
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Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

Xing Wang, Constantinos Hatzoglou, Brian Sneed, et al.
Nature Communications 11 (1) (2020)
https://doi.org/10.1038/s41467-020-14832-w

A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability

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Microscopy and Microanalysis 25 (2) 425 (2019)
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New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

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Microscopy and Microanalysis 23 (2) 247 (2017)
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Accuracy of analyses of microelectronics nanostructures in atom probe tomography

F Vurpillot, N Rolland, R Estivill, S Duguay and D Blavette
Semiconductor Science and Technology 31 (7) 074002 (2016)
https://doi.org/10.1088/0268-1242/31/7/074002