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Cited article:

Dynamic evolution and fracture of multilayer field emitters in atom probe tomography: a new interpretation

Nicolas Rolland, François Vurpillot, Sébastien Duguay, Didier Blavette

Eur. Phys. J. Appl. Phys., 72 2 (2015) 21001

Published online: 2015-11-03

DOI: https://doi.org/10.1051/epjap/2015150233

This article has been cited by the following article(s):

New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint

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DOI: 10.1017/S1431927617000253
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Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

J.P. Barnes, A. Grenier, I. Mouton, et al.
Scripta Materialia (2017)
DOI: 10.1016/j.scriptamat.2017.05.012
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Atom Probe Tomography

F. Vurpillot
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DOI: 10.1016/B978-0-12-804647-0.00007-3
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Accuracy of analyses of microelectronics nanostructures in atom probe tomography

F Vurpillot, N Rolland, R Estivill, S Duguay and D Blavette
Semiconductor Science and Technology 31 (7) 074002 (2016)
DOI: 10.1088/0268-1242/31/7/074002
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Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements

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Nature Communications 11 (1) (2020)
DOI: 10.1038/s41467-020-14832-w
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Atom Probe Reconstruction With a Locally Varying Emitter Shape

Daniel Beinke and Guido Schmitz
Microscopy and Microanalysis 25 (2) 280 (2019)
DOI: 10.1017/S1431927618015350
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Compensating Local Magnifications in Atom Probe Tomography for Accurate Analysis of Nano-Sized Precipitates

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Microscopy and Microanalysis 1 (2021)
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A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability

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