Articles citing this article

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Cited article:

AFM-utilizing approach to search for new oxide materials for perspective applications in memristive devices

I. Batko, M. Batkova

Eur. Phys. J. Appl. Phys., 58 2 (2012) 20102

Published online: 2012-05-25

DOI: https://doi.org/10.1051/epjap/2012120102

This article has been cited by the following article(s):

Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

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Beilstein Journal of Nanotechnology 10 1596 (2019)
https://doi.org/10.3762/bjnano.10.155

Kelvin Probe Force Microscopy

Evgheni Strelcov, Mahshid Ahmadi and Sergei V. Kalinin
Springer Series in Surface Sciences, Kelvin Probe Force Microscopy 65 251 (2018)
https://doi.org/10.1007/978-3-319-75687-5_10

Electrical conduction of Ti/TiOx/Ti structures at low temperatures and high magnetic fields

Marianna Batkova and Ivan Batko
The European Physical Journal Applied Physics 73 (3) 30301 (2016)
https://doi.org/10.1051/epjap/2016150567

Memristive Behavior of Nb/NbOx/Nb Structures Prepared by Local Anodic Oxidation1

I. Batko and M. Batkova
Materials Today: Proceedings 3 (3) 803 (2016)
https://doi.org/10.1016/j.matpr.2016.02.012