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Cited article:

Object size effect on the contact potential difference measured by scanning Kelvin probe method

B. Polyakov, R. Krutokhvostov, A. Kuzmin, E. Tamanis, I. Muzikante, I. Tale

Eur. Phys. J. Appl. Phys., 51 2 (2010) 21201

Published online: 2010-07-07

DOI: https://doi.org/10.1051/epjap/2010088

This article has been cited by the following article(s):

Three-Dimensional Kelvin Probe Microscopy for Characterizing In-Plane Piezoelectric Potential of Laterally Deflected ZnO Micro-/Nanowires

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Advanced Functional Materials 22 (3) 652 (2012)
DOI: 10.1002/adfm.201102325
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On the correlation between surface morphology and electron work function of indium tin oxide

Mingshan Xue, Hainan Wu, Junfei Ou, et al.
Journal of Applied Physics 111 (12) 123714 (2012)
DOI: 10.1063/1.4730388
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