Articles citing this article

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Cited article:

An efficient method for electro-thermo-mechanical coupling effect in electrical contact on rough surfaces

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International Journal of Heat and Mass Transfer 226 125492 (2024)
https://doi.org/10.1016/j.ijheatmasstransfer.2024.125492

Modeling multi-physics electrical contact on rough surfaces considering elastic-plastic deformation

You-Hua Li, Fei Shen, Mehmet Ali Güler and Liao-Liang Ke
International Journal of Mechanical Sciences 269 109066 (2024)
https://doi.org/10.1016/j.ijmecsci.2024.109066

Electrical Contact During a Rolling Vibratory Motion Considering Mixed Lubrication

Robert L. Jackson and Santosh Angadi
Journal of Tribology 145 (8) (2023)
https://doi.org/10.1115/1.4062295

Tarnishing (Ag2S) Layer on Silver-Plated Electrical Contacts: Its Influence on Electrical Contact Resistance

Bruno Alderete, Frank Mücklich and Sebastian Suarez
IEEE Transactions on Components, Packaging and Manufacturing Technology 13 (1) 45 (2023)
https://doi.org/10.1109/TCPMT.2023.3238672

Influence of topography on electrical contact resistance of copper-based materials

Bruno Alderete, U Pranav Nayak, Frank Mücklich and Sebastian Suarez
Surface Topography: Metrology and Properties 11 (2) 025027 (2023)
https://doi.org/10.1088/2051-672X/acdfea

A Comprehensive Review of the Finite Element Modeling of Electrical Connectors Including Their Contacts

Santosh V. Angadi, Robert L. Jackson, Vijayakumar Pujar and M. R. Tushar
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 (5) 836 (2020)
https://doi.org/10.1109/TCPMT.2020.2982207

A comparison of nanoscale measurements with the theoretical models of real and nominal contact areas

Yang Xu, Robert L Jackson, Yan Chen, Anqi Zhang and Barton C Prorok
Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology 234 (11) 1735 (2020)
https://doi.org/10.1177/1350650120905184

Film-type connection system toward flexible electronics

Ryosuke Mitsui, Seiya Takahashi, Shin-ichiro Nakajima, Ken-ichi Nomura and Hirobumi Ushijima
Japanese Journal of Applied Physics 53 (5S3) 05HB04 (2014)
https://doi.org/10.7567/JJAP.53.05HB04