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Theoretical Concepts of X-Ray Nanoscale Analysis

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Springer Series in Materials Science, Theoretical Concepts of X-Ray Nanoscale Analysis 183 71 (2014)
DOI: 10.1007/978-3-642-38177-5_3
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Probing surface and interface morphology with Grazing Incidence Small Angle X-Ray Scattering

Gilles Renaud, Rémi Lazzari and Frédéric Leroy
Surface Science Reports 64 (8) 255 (2009)
DOI: 10.1016/j.surfrep.2009.07.002
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Self-consistent approach to x-ray reflection from rough surfaces

I. D. Feranchuk, S. I. Feranchuk and A. P. Ulyanenkov
Physical Review B 75 (8) 085414 (2007)
DOI: 10.1103/PhysRevB.75.085414
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Incorporation of interfacial roughness into recursion matrix formalism of dynamical X-ray diffraction in multilayers and superlattices

Ihar Lobach, Andrei Benediktovitch and Alexander Ulyanenkov
Journal of Applied Crystallography 50 (3) 681 (2017)
DOI: 10.1107/S1600576717004137
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