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Cited article:

Microstructural characterization of porous silicon for use in optoelectronic devices

D. Abidi, S. Romdhane, A. Brunet-Bruneau, J.-L. Fave

Eur. Phys. J. Appl. Phys., 45 1 (2009) 10601

Published online: 2009-01-14

DOI: https://doi.org/10.1051/epjap:2008192

This article has been cited by the following article(s):

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Handbook of Porous Silicon

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Temperature-Dependent Photoluminescence of Silicon Nanoporous Pillar Array

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Synthesis and Properties of “Black Silicon” Formed by Pd-Catalyst Etching in NH4HF2/H2O2Solution

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Optical Absorption, Photoluminescence, and Raman Scattering Studies on Si Nanowire Arrays Formed in Ag2SO4−HF−H2O Solution

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Journal of Applied Physics 113 (17) (2013)
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A new bottom-up methodology to produce silicon layers with a closed porosity nanostructure and reduced refractive index

V Godinho, J Caballero-Hernández, D Jamon, et al.
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Raman scattering studies of heavily doped microcrystalline porous silicon and porous silicon free-standing membranes

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Physical Review B 82 (7) (2010)
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