Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Measurement of azo dye film with large photo-induced birefringence and complex refractive index

Yiyang Gao, Jacob Y. Ho, Shu-Tuen Tang, Wanlong Zhang, Man-chun Tseng, Olena Vashchenko, Valerii Vashchenko, Fion Yeung and Hoi-Sing Kwok
AIP Advances 13 (5) (2023)
https://doi.org/10.1063/5.0149433

Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Najat Andam, Siham Refki, Hidekazu Ishitobi, Yasushi Inouye and Zouheir Sekkat
Photonics 8 (2) 41 (2021)
https://doi.org/10.3390/photonics8020041

4-Nitro-Azo Dye-Sensitized Optical Behavior of Organic/Inorganic Hybrid Networks in Zirconium-Based Thin Films: Effect of Cu Co-doping

S. Salari, F. E. Ghodsi and M. Pasandideh Nadamani
Journal of Inorganic and Organometallic Polymers and Materials 30 (3) 603 (2020)
https://doi.org/10.1007/s10904-019-01345-3

Guided-mode-resonance-enhanced measurement of thin-film absorption

Yifei Wang, Yin Huang, Jingxuan Sun, Santosh Pandey and Meng Lu
Optics Express 23 (22) 28567 (2015)
https://doi.org/10.1364/OE.23.028567

Ellipsometric investigations of Fe3+-doped polyvinyl alcohol films

N. Khalifa, B. Yacoubi, I. Attar, A. Bardaoui and R. Chtourou
Colloid and Polymer Science 291 (11) 2705 (2013)
https://doi.org/10.1007/s00396-013-3022-x

Nanomechanical Actuation of a Silicon Cantilever Using an Azo Dye, Self-Assembled Monolayer

A. Joseph Rastegar, Michael Vosgueritchian, Joseph C. Doll, Joseph R. Mallon and Beth L. Pruitt
Langmuir 29 (23) 7118 (2013)
https://doi.org/10.1021/la3034676

Measurement of the absorption of concentrated dyes and their use for quantitative imaging of surface topography

M. A. MODEL, A. K. KHITRIN and J. L. BLANK
Journal of Microscopy 231 (1) 156 (2008)
https://doi.org/10.1111/j.1365-2818.2008.02026.x