Articles citing this article

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Cited article:

Low temperature semi-quantitative analysis of local electrical field in silicon diode by transmission electron microscopy

C. Cabanel, D. Brouri, J. Y. Laval

Eur. Phys. J. Appl. Phys., 34 2 (2006) 107-116

Published online: 2006-05-18

DOI: https://doi.org/10.1051/epjap:2006042

This article has been cited by the following article(s):

Low energy scanning transmission electron beam induced current for nanoscale characterization of p–n junctions

Patrick Peretzki, Benedikt Ifland, Christian Jooss and Michael Seibt
physica status solidi (RRL) – Rapid Research Letters 11 (1) (2017)
https://doi.org/10.1002/pssr.201600358