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Cited article:

Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2

E.I. Rau, A.A. Tatarintsev and E.Yu. Zykova
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 460 141 (2019)
https://doi.org/10.1016/j.nimb.2018.12.030

Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons

E. I. Rau, A. A. Tatarintsev, E. Yu. Zykova, et al.
Physics of the Solid State 59 (8) 1526 (2017)
https://doi.org/10.1134/S1063783417080212

New possibilities and some artifacts of the cathodoluminescent mode in scanning electron microscopy

S. V. Zaitsev, S. Yu. Kupreenko, A. E. Luk’yanov, et al.
Bulletin of the Russian Academy of Sciences: Physics 80 (12) 1431 (2016)
https://doi.org/10.3103/S1062873816120200

Trapping-charging ability and electrical properties study of amorphous insulator by dielectric spectroscopy

Omar Mekni, Hakim Arifa, Besma Askri, Khaled Raouadi, Gilles Damamme and Béchir Yangui
Journal of Applied Physics 116 (10) (2014)
https://doi.org/10.1063/1.4895124

An explanation of certain contradictions in the treatment of the charging dynamics of dielectric targets under the effect of electron irradiation

E. N. Evstaf’eva, E. I. Rau and A. A. Tatarintsev
Moscow University Physics Bulletin 68 (2) 128 (2013)
https://doi.org/10.3103/S0027134913020045

Time dependence of secondary electron yield and of surface potential during charging of amorphous silica target

B. Askri, K. Raouadi, R. Renoud and B. Yangui
Journal of Electrostatics 67 (4) 695 (2009)
https://doi.org/10.1016/j.elstat.2009.03.006

Bombarding insulating foils with highly energetic ions

G. Lanzanò, E. De Filippo, S. Hagmann, H. Rothard and C. Volant
Radiation Effects and Defects in Solids 162 (5) 303 (2007)
https://doi.org/10.1080/10420150601104908

Electron beam charging of insulators: A self-consistent flight-drift model

M. Touzin, D. Goeuriot, C. Guerret-Piécourt, et al.
Journal of Applied Physics 99 (11) 114110 (2006)
https://doi.org/10.1063/1.2201851