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Influence of ion implantation and electron pre-irradiation on charging of dielectrics under electron beam irradiation: Application to SiO2
E.I. Rau, A.A. Tatarintsev and E.Yu. Zykova Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 460 141 (2019) https://doi.org/10.1016/j.nimb.2018.12.030
Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons
New possibilities and some artifacts of the cathodoluminescent mode in scanning electron microscopy
S. V. Zaitsev, S. Yu. Kupreenko, A. E. Luk’yanov, et al. Bulletin of the Russian Academy of Sciences: Physics 80(12) 1431 (2016) https://doi.org/10.3103/S1062873816120200
Trapping-charging ability and electrical properties study of amorphous insulator by dielectric spectroscopy
Omar Mekni, Hakim Arifa, Besma Askri, Khaled Raouadi, Gilles Damamme and Béchir Yangui Journal of Applied Physics 116(10) (2014) https://doi.org/10.1063/1.4895124
An explanation of certain contradictions in the treatment of the charging dynamics of dielectric targets under the effect of electron irradiation