Articles citing this article

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Cited article:

Imaging atomically sharp crack tips in mica by contact mode AFM under ambient conditions

Y. Gan, W. Chu, L. Qiao

Eur. Phys. J. Appl. Phys., 31 1 (2005) 37-44

Published online: 2005-04-14

DOI: https://doi.org/10.1051/epjap:2005026

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2D silver nanocrystal ordering modulated by various substrates and revealed using oxygen plasma treatment

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STM studies of the reconstructed Au(111) thin-film at elevated temperatures

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