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Cited article:

Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in Si single crystals implanted by helium ions at 600 °C

W.T. Han, H.P. Liu and B.S. Li
Applied Surface Science 455 433 (2018)
https://doi.org/10.1016/j.apsusc.2018.05.228

Effects of surface oxide layer on nanocavity formation and silver gettering in hydrogen ion implanted silicon

Sebastian Naczas, Faisal Yaqoob and Mengbing Huang
Journal of Applied Physics 114 (2) 023502 (2013)
https://doi.org/10.1063/1.4812736

Two Layer Surface Exfoliation on Si3N4/Si by Sequential Implantation of He and H Ions

Mengkai Li, Zhuo Wang, Changlong Liu, et al.
Journal of Electronic Materials 38 (9) 1990 (2009)
https://doi.org/10.1007/s11664-009-0768-5

Effects of the oxide layer on cavity formation and He desorption in He implanted silicon

Changlong Liu, Zhuo Wang, Mengkai Li, et al.
Journal of Physics D: Applied Physics 41 (13) 135108 (2008)
https://doi.org/10.1088/0022-3727/41/13/135108

Buried silicon dioxide formation in a precursor nanocavity layer in Si

A. van Veen, A. Rivera, H. Schut and H. van Gog
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 216 264 (2004)
https://doi.org/10.1016/j.nimb.2003.11.044