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Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in Si single crystals implanted by helium ions at 600 °C
Buried silicon dioxide formation in a precursor nanocavity layer in Si
A. van Veen, A. Rivera, H. Schut and H. van Gog Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 216 264 (2004) https://doi.org/10.1016/j.nimb.2003.11.044