Structural properties and recombination processes in hydrogenated polymorphous silicon
Eur. Phys. J. AP, 22 3 (2003) 171-178
Published online: 2003-05-14
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy
Stephanie N. Bogle, Lakshmi N. Nittala, Ray D. Twesten, Paul M. Voyles and John R. AbelsonUltramicroscopy 110 (10) 1273 (2010)
https://doi.org/10.1016/j.ultramic.2010.05.001
Raman spectroscopy of nano-structured silicon to study the embedded crystallites
V. Tripathi, M. Nazrul Islam, Y. N. Mohapatra and P. Roca i CabarrocasThe European Physical Journal Applied Physics 39 (3) 203 (2007)
https://doi.org/10.1051/epjap:2007111
Role of hydrogen diffusion on the growth of polymorphous and microcrystalline silicon thin films
A. Fontcuberta i Morral and P. Roca i CabarrocasThe European Physical Journal Applied Physics 35 (3) 165 (2006)
https://doi.org/10.1051/epjap:2006094
Macrophage Serum‐Based Adhesion to Plasma‐Processed Surface Chemistry is Distinct from That Exhibited by Fibroblasts
Marisha L. Godek, Galiya Sh. Malkov, Ellen R. Fisher and David W. GraingerPlasma Processes and Polymers 3 (6-7) 485 (2006)
https://doi.org/10.1002/ppap.200600007
Deep defects and their electron-capture cross sections in polymorphous silicon-germanium thin films
M. Meaudre, M. E. Gueunier-Farret, R. Meaudre, J. P. Kleider, S. Vignoli and B. CanutJournal of Applied Physics 98 (3) (2005)
https://doi.org/10.1063/1.1999831
New approaches for the production of nano‐, micro‐, and polycrystalline silicon thin films
P. Roca i Cabarrocasphysica status solidi (c) 1 (5) 1115 (2004)
https://doi.org/10.1002/pssc.200304328
Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nuclear measurements
A. Fontcuberta i Morral, P. Roca i Cabarrocas and C. ClercPhysical Review B 69 (12) 125307 (2004)
https://doi.org/10.1103/PhysRevB.69.125307