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Cited article:

Study of Ag porous film using X-ray reflectivity and pattern formation using Atomic Force Microscope

S. Banerjee, S. Mukherjee, S. Kundu

Eur. Phys. J. AP, 17 2 (2002) 99-106

Published online: 2002-02-15

DOI: https://doi.org/10.1051/epjap:2002002

This article has been cited by the following article(s):

Imaging distribution of local stiffness over surfaces using atomic force acoustic microscopy

S Banerjee, N Gayathri, S R Shannigrahi, et al.
Journal of Physics D: Applied Physics 40 (8) 2539 (2007)
https://doi.org/10.1088/0022-3727/40/8/019

Mass dependent surface interface modification of Ag/Co films under controlled ion beam irradiation

S. Kundu
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 242 (1-2) 542 (2006)
https://doi.org/10.1016/j.nimb.2005.08.206

Interface modification of Ag/Co system: X-ray reflectivity study

S. Kundu
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 212 489 (2003)
https://doi.org/10.1016/S0168-583X(03)01745-2

Early growth stages of sputter deposited Ag on native SiO2

S Banerjee and S Kundu
Surface Science 537 (1-3) 153 (2003)
https://doi.org/10.1016/S0039-6028(03)00612-5