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Cited article:

Real time spectroscopic ellipsometry on ultrathin (<50Å) hydrogenated amorphous silicon films on Si(100) and GaAs(100)

P. J. van den Oever, M. C. M. van de Sanden and W. M. M. Kessels
Journal of Applied Physics 101 (12) (2007)
https://doi.org/10.1063/1.2749466

A full 3-D material stability analysis of a classical elasto-plastic medium through a linear perturbation approach

N. G. Diouta and I. Shahrour
The European Physical Journal Applied Physics 34 (2) 85 (2006)
https://doi.org/10.1051/epjap:2006043