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Cited article:

Simultaneous measurement of film and substrate optical parameters from multiple sample single wavelength ellipsometric data

T. Easwarakhanthan, P. Alnot

Eur. Phys. J. AP, 6 3 (1999) 285-292

Published online: 1999-06-15

DOI: https://doi.org/10.1051/epjap:1999185

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References

This article has been cited by the following article(s):

Semi-analytical method for n–k inversion of ellipsometry data

Mickaël Gilliot
Applied Optics 58 (4) 800 (2019)
https://doi.org/10.1364/AO.58.000800