Articles citing this article

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Cited article:

Second harmonic generation in the near field and far field: A sensitive tool to probe crystalline homogeneity

Laurent Mahieu-Williame, Samuel Grésillon, Mireille Cuniot-Ponsard and Claude Boccara
Journal of Applied Physics 101 (8) (2007)
https://doi.org/10.1063/1.2719278

Apertureless scanning near-field optical microscopy: numerical modeling of the lock-in detection

Radouane Fikri, Thomas Grosges and Dominique Barchiesi
Optics Communications 232 (1-6) 15 (2004)
https://doi.org/10.1016/j.optcom.2003.12.027

Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of a background field

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Optics Communications 230 (4-6) 245 (2004)
https://doi.org/10.1016/j.optcom.2003.11.029

Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy

Sébastien Aubert, Aurélien Bruyant, Sylvain Blaize, et al.
Journal of the Optical Society of America B 20 (10) 2117 (2003)
https://doi.org/10.1364/JOSAB.20.002117

Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling

Radouane Fikri, Thomas Grosges and Dominique Barchiesi
Optics Letters 28 (22) 2147 (2003)
https://doi.org/10.1364/OL.28.002147

Preparation of cantilevered W tips for atomic force microscopy and apertureless near-field scanning optical microscopy

W. X. Sun, Z. X. Shen, F. C. Cheong, et al.
Review of Scientific Instruments 73 (8) 2942 (2002)
https://doi.org/10.1063/1.1494867

Coherent light scattering and resonant energy transfer in an apertureless scanning near-field optical microscope

Jaromír Fiurášek, Boris Chernobrod, Yehiam Prior and Ilya Sh. Averbukh
Physical Review B 63 (4) (2001)
https://doi.org/10.1103/PhysRevB.63.045420

Analysis of the influence of the tip vibration in the formation of images in apertureless scanning near-field optical microscopy

P.M Adam, J.L Bijeon, G Viardot and P Royer
Optics Communications 174 (1-4) 91 (2000)
https://doi.org/10.1016/S0030-4018(99)00700-2