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Near-field reflection backscattering apertureless optical microscopy: Application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniques
Impact of optical in-plane anisotropy on near-field phonon polariton spectroscopy
S. Schneider, J. Seidel, S. Grafström, L. M. Eng, S. Winnerl, D. Stehr and M. Helm Applied Physics Letters 90(14) (2007) https://doi.org/10.1063/1.2718489
Direct imaging of a laser mode via midinfrared near-field microscopy
Virginie Moreau, Michael Bahriz, Raffaele Colombelli, Paul-Arthur Lemoine, Yannick De Wilde, Luke R. Wilson and Andrey B. Krysa Applied Physics Letters 90(20) (2007) https://doi.org/10.1063/1.2738189
Optical tweezers in interaction with an apertureless probe
Patrick C. Chaumet, Bernard Pouligny, Rumiana Dimova and Nešo Sojic Journal of Applied Physics 102(2) (2007) https://doi.org/10.1063/1.2759892
NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY WITH POINTED PROBES
Definition of a simple resolution criterion in an Apertureless Scanning Near-Field Optical Microscope (A-SNOM): contribution of the tip vibration and lock-in detection
J.-L. Bijeon, P.-M. Adam, D. Barchiesi and P. Royer The European Physical Journal Applied Physics 26(1) 45 (2004) https://doi.org/10.1051/epjap:2004021
Probing photonic and optoelectronic structures by Apertureless Scanning Near‐Field Optical Microscopy
Renaud Bachelot, Gilles Lerondel, Sylvain Blaize, Sebastien Aubert, Aurelien Bruyant and Pascal Royer Microscopy Research and Technique 64(5-6) 441 (2004) https://doi.org/10.1002/jemt.20102
Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of a background field
Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy
Sébastien Aubert, Aurélien Bruyant, Sylvain Blaize, et al. Journal of the Optical Society of America B 20(10) 2117 (2003) https://doi.org/10.1364/JOSAB.20.002117
Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy