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Cited article:

Activation of dislocation sources in γ-phases of nickel-base superalloys studied by use of atomic-force microscopy and transmission electron microscopy

F. Pettinari-Sturmel, C. Coupeau, N. Clément and A. Coujou
Materials Science and Engineering: A 387-389 103 (2004)
https://doi.org/10.1016/j.msea.2004.02.084

Atomic force microscopy observations of in situ deformed materials: application to single crystals and thin films on substrates

C. Coupeau and J. Grilhé
Journal of Microscopy 203 (1) 99 (2001)
https://doi.org/10.1046/j.1365-2818.2001.00903.x