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Cited article:

CHARACTERIZATION OF CONTACT INTERFACE, FILM SHEET RESISTANCE AND 1/f NOISE WITH CIRCULAR CONTACTS

L. K. J. VANDAMME
Fluctuation and Noise Letters 10 (04) 467 (2011)
https://doi.org/10.1142/S0219477511000740

On low-frequency noise of polycrystalline GexSi1−x for sub-micron CMOS technologies

X.Y Chen, J.A Johansen, C Salm and A.D van Rheenen
Solid-State Electronics 45 (11) 1967 (2001)
https://doi.org/10.1016/S0038-1101(01)00242-8