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Cited article:

Electron scattering mechanisms in ITGO (Sn+Ge doped In₂O₃) thin films for low emittance window coatings

J. Salardenne, C. Marcel, Y. Xu, G. Couturier

Eur. Phys. J. AP, 3 3 (1998) 233-235

Published online: 1998-09-15

DOI: https://doi.org/10.1051/epjap:1998225

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This article has been cited by the following article(s):

Microstructural and optical characterization of germanium:indium tin oxide (Ge:ITO) nanocomposite films

C.G. Allen, G.H. Shih and B.G. Potter
Materials Science and Engineering: B 175 (2) 150 (2010)
https://doi.org/10.1016/j.mseb.2010.07.018

Scattering mechanisms and electronic behavior in transparent conducting ZnxIn2Ox+3 indium–zinc oxide thin films

C. Marcel, N. Naghavi, G. Couturier, J. Salardenne and J. M. Tarascon
Journal of Applied Physics 91 (7) 4291 (2002)
https://doi.org/10.1063/1.1445496

Electrical and optical properties of sputter deposited tin doped indium oxide thin films with silver additive

Annette Hultåker, Kenneth Järrendahl, Jun Lu, Claes-Göran Granqvist and Gunnar A. Niklasson
Thin Solid Films 392 (2) 305 (2001)
https://doi.org/10.1016/S0040-6090(01)01048-3

Optimization of In2O3 transparent conductive films by Ge ion implantation

E Baba Ali, G Sorensen, J Ouerfelli, J.C Bernède and H El Maliki
Applied Surface Science 152 (1-2) 1 (1999)
https://doi.org/10.1016/S0169-4332(99)00312-8