Articles citing this article

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Cited article:

Characteristics of Dislocation Half-Loop Arrays in 4H-SiC Homo-Epilayer

Z. Zhang, R.E. Stahlbush, P. Pirouz and T.S. Sudarshan
Journal of Electronic Materials 36 (5) 539 (2007)
https://doi.org/10.1007/s11664-007-0129-1

Propagation of stacking faults from surface damage in SiC PiN diodes

Z. Zhang, S. I. Maximenko, A. Shrivastava, et al.
Applied Physics Letters 88 (6) 062101 (2006)
https://doi.org/10.1063/1.2172015

Atomic structure and core composition of partial dislocations and dislocation fronts in β-SiC by high-resolution transmission electron microscopy

M. Lancin, C. Ragaru and C. Godon
Philosophical Magazine B 81 (11) 1633 (2001)
https://doi.org/10.1080/13642810108223108