Articles citing this article

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Cited article:

Reduction of residual stress in polymorphous silicon germanium films and their evaluation in microbolometers

Ricardo Jimenez, Mario Moreno, Alfonso Torres, Roberto Ambrosio, Aurelio Heredia, Arturo Ponce

Eur. Phys. J. Appl. Phys., 89 3 (2020) 30101

Published online: 2020-04-23

DOI: https://doi.org/10.1051/epjap/2020190245

This article has been cited by the following article(s):

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N-type amorphous silicon-germanium thin films with embedded nanocrystals as a novel thermoelectric material of elevated ZT

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Carlos Ascencio-Hurtado, Alfonso Torres, Mario Moreno and Roberto Ambrosio
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