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Cited article:
Peng Zhang
Eur. Phys. J. Appl. Phys., 82 1 (2018) 10702
Published online: 2018-07-18
This article has been cited by the following article(s):
6 articles
Exploring the temperature effect on line-scan profile of a pitch structure under electron irradiation
Peng Zhang Indian Journal of Physics 98 (2) 525 (2024) https://doi.org/10.1007/s12648-023-02817-6
Study on line‐scan profile for a trapezoid line under varying sample temperatures through Monte–Carlo simulation
Peng Zhang Journal of Microscopy 296 (1) 63 (2024) https://doi.org/10.1111/jmi.13343
Study on the temperature effect on line-scan profile of nanorods under electron irradiation
Peng Zhang, Zhiyao Ma and Dengmei Li Physica Scripta 98 (1) 015705 (2023) https://doi.org/10.1088/1402-4896/aca634
Relation Between Electron Yield and Temperature: Exploring a Novel Route to Measure the Nanoscale Temperature
Peng Zhang, Zhiyao Ma and Dengmei Li Brazilian Journal of Physics 53 (3) (2023) https://doi.org/10.1007/s13538-023-01280-2
Study on the Heat Generation during Electron Irradiation for Two Specific Nanostructures
Peng Zhang Moscow University Physics Bulletin 76 (6) 455 (2021) https://doi.org/10.3103/S0027134921060102
Exploring the heat transfer for spherical nanoparticles under electron irradiation
Peng Zhang, Lidan Zhang, Ruvarashe F Dambire and Yanlin Zhang Physica Scripta 96 (9) 095702 (2021) https://doi.org/10.1088/1402-4896/ac04de