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Cited article:

Very thick mixture oxide ion beam sputtering films for investigation of nonlinear material properties

Morten Steinecke, Kevin Kiedrowski, Marco Jupé, Detlev Ristau

Eur. Phys. J. Appl. Phys., 80 3 (2017) 30301

Published online: 2017-11-29

DOI: https://doi.org/10.1051/epjap/2017170239

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