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Cited article:

Determination of bulk and interface density of states in metal oxide semiconductor thin-film transistors by using capacitance–voltage characteristics

Xixiong Wei, Wanling Deng, Jielin Fang, Xiaoyu Ma, Junkai Huang

Eur. Phys. J. Appl. Phys., 80 1 (2017) 10103

Published online: 2017-10-05

DOI: https://doi.org/10.1051/epjap/2017170179

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