Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Inverse optical scatterometry using sketch-guided deep learning

Shuo Liu, Xiuguo Chen, Tianjuan Yang, Jiahao Zhang and Shiyuan Liu
Optics Express 32 (11) 20303 (2024)
https://doi.org/10.1364/OE.524091

Neural network driven sensitivity analysis of diffraction-based overlay metrology performance to target defect features

Kai Wang, Kai Meng, Hangying Zhang and Peihuang Lou
Measurement Science and Technology 35 (9) 095201 (2024)
https://doi.org/10.1088/1361-6501/ad4d0e

Rapid ellipsometric determination and mapping of alloy stoichiometry with a neural network

A Yann Battie, Adrià Canós Valero, David Horwat and Aotmane En Naciri
Optics Letters 47 (8) 2117 (2022)
https://doi.org/10.1364/OL.457147

Experimental identification of a grating profile using neural network classifiers in optical scatterometry

Moustapha Godi Tchéré, Stéphane Robert, Zaki Sabit Fawzi, et al.
Applied Optics 60 (26) 7929 (2021)
https://doi.org/10.1364/AO.432987

Reconstruction of a complex profile shape by weighting basic characterization results for nanometrology

Moustapha Godi Tchéré, Stéphane Robert, Zaki Sabit Fawzi and Bernard Bayard
Applied Optics 58 (22) 6118 (2019)
https://doi.org/10.1364/AO.58.006118