Articles citing this article

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Cited article:

() preferential orientation of polycrystalline AlN grown on SiO₂/Si wafers by reactive sputter magnetron technique

Juan Bürgi, Javier García Molleja, Raúl Bolmaro, Mattia Piccoli, Edoardo Bemporad, Aldo Craievich, Jorge Feugeas

Eur. Phys. J. Appl. Phys., 74 1 (2016) 10301

Published online: 2016-04-01

DOI: https://doi.org/10.1051/epjap/2016150446

This article has been cited by the following article(s):

Synchrotron Radiation Applied to Real-Time Studies of the Kinetics of Growth of Aluminum Nitride Thin Multilayers

J. García Molleja, J. Bürgi, G. Kellermann, et al.
The Journal of Physical Chemistry B 123 (7) 1679 (2019)
https://doi.org/10.1021/acs.jpcb.8b09496

Polarization engineered enhancement mode GaN HEMT: Design and investigation

Sumit Verma, Sajad A. Loan and Abdullah G. Alharbi
Superlattices and Microstructures 119 181 (2018)
https://doi.org/10.1016/j.spmi.2018.04.041