Articles citing this article

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Cited article:

2D Electric field imagery in 4H-SiC power diodes using OBIC technique

Hassan Hamad, Pascal Bevilacqua, Dominique Planson, Christophe Raynaud, Dominique Tournier, Bertrand Vergne, Mihai Lazar, Pierre Brosselard

Eur. Phys. J. Appl. Phys., 72 2 (2015) 20101

Published online: 2015-10-30

DOI: https://doi.org/10.1051/epjap/2015150054

This article has been cited by the following article(s):

An insight into optical beam induced current microscopy: Concepts and applications

Guan‐Yu Zhuo, Soumyabrata Banik, Fu‐Jen Kao, Gazi A. Ahmed, Nayan M. Kakoty, Nirmal Mazumder and Ankur Gogoi
Microscopy Research and Technique 85 (11) 3495 (2022)
https://doi.org/10.1002/jemt.24212

OBIC technique applied to wide bandgap semiconductors from 100 K up to 450 K

H Hamad, D Planson, C Raynaud and P Bevilacqua
Semiconductor Science and Technology 32 (5) 054001 (2017)
https://doi.org/10.1088/1361-6641/aa641d