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Cited article:

Research of carrier mobility in NPD through negative differential susceptance spectra

Hui Xu, Chao Tang, Wen-Juan Zhai, Rui-Lan Liu, Zhou Rong, Qu-Li Fan, Wei Huang

Eur. Phys. J. Appl. Phys., 68 3 (2014) 30202

Published online: 2014-12-12

DOI: https://doi.org/10.1051/epjap/2014140298

This article has been cited by the following article(s):

The negative mobility: An outcome of the electric field at the hole-injecting metal/organic semiconductor interface that varies as a linear function of the applied bias

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Thickness Dependence of Carrier Mobility and the Interface Trap Free Energy Investigated by Impedance Spectroscopy in Organic Semiconductors

Hui Xu, Wen-Juan Zhai, Chao Tang, et al.
The Journal of Physical Chemistry C 120 (31) 17184 (2016)
https://doi.org/10.1021/acs.jpcc.6b03964

Transition metal oxide as anode interface buffer for impedance spectroscopy

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The European Physical Journal Applied Physics 72 (3) 30201 (2015)
https://doi.org/10.1051/epjap/2015150305