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Cited article:

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Impedance spectroscopy of Au/TiO2/n-Si metal-insulator-semiconductor (MIS) capacitor

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Electrical and impedance properties of MPS structure based on (Cu2O–CuO–PVA) interfacial layer

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Journal of Materials Science: Materials in Electronics 29 (10) 8234 (2018)
https://doi.org/10.1007/s10854-018-8830-9