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Cited article:

Structural Characteristics and Optical Properties of SiC Thin Films Produced by the RF-PVD Method

M.A. Davlatov, K.T. Davranov, X.T. Dovranov, S.N. Xusanov, A.R. Kodirov and S. Xolikulova
East European Journal of Physics (2) 330 (2025)
https://doi.org/10.26565/2312-4334-2025-2-41