Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

A Thin Elastic NFC Forum Type 1 Compatible RFID Tag

Piotr Zbigniew Wieczorek, Krzysztof Starecki, Krzysztof Gołofit, Maciej Radtke and Marcin Pilarz
IEEE Journal of Solid-State Circuits 59 (3) 935 (2024)
https://doi.org/10.1109/JSSC.2023.3300256

A Tiny Flexible Differential Tension Sensor

Piotr Z. Wieczorek, Krzysztof Starecki, Krzysztof Gołofit, Maciej Radtke and Marcin Pilarz
Sensors 23 (4) 1819 (2023)
https://doi.org/10.3390/s23041819

4‐2: Invited Paper: High Performance Top Gate Oxide TFT Technology for Large Area Flexible AMOLED Display

Weiran Cao, Yuan-Jun Hsu, Zheng Jiang, Fangmei Liu, Yuan-Chun Wu and Xin Zhang
SID Symposium Digest of Technical Papers 52 (1) 21 (2021)
https://doi.org/10.1002/sdtp.14600

Recent review on improving mechanical durability for flexible oxide thin film transistors

Ki-Lim Han, Hyun-Jun Jeong, Beom-Su Kim, Won-Bum Lee and Jin-Seong Park
Journal of Physics D: Applied Physics 52 (48) 483002 (2019)
https://doi.org/10.1088/1361-6463/ab3b6b

Research Progress on Flexible Oxide-Based Thin Film Transistors

Lirong Zhang, Wenping Xiao, Weijing Wu and Baiquan Liu
Applied Sciences 9 (4) 773 (2019)
https://doi.org/10.3390/app9040773

Review of recent progresses on flexible oxide semiconductor thin film transistors based on atomic layer deposition processes

Jiazhen Sheng, Ki-Lim Han, TaeHyun Hong, Wan-Ho Choi and Jin-Seong Park
Journal of Semiconductors 39 (1) 011008 (2018)
https://doi.org/10.1088/1674-4926/39/1/011008

Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays

Min Soo Bae, Chuntaek Park, Dongseok Shin, Sang Myung Lee and Ilgu Yun
Solid-State Electronics 133 1 (2017)
https://doi.org/10.1016/j.sse.2017.04.003

Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs

Myung Keun Lee, Choong-Ki Kim, Jeong Woo Park, et al.
IEEE Transactions on Electron Devices 64 (8) 3189 (2017)
https://doi.org/10.1109/TED.2017.2717444

Review of recent advances in flexible oxide semiconductor thin-film transistors

Jiazhen Sheng, Hyun-Jun Jeong, Ki-Lim Han, TaeHyun Hong and Jin-Seong Park
Journal of Information Display 18 (4) 159 (2017)
https://doi.org/10.1080/15980316.2017.1385544

Metal oxide semiconductor thin-film transistors for flexible electronics

Luisa Petti, Niko Münzenrieder, Christian Vogt, et al.
Applied Physics Reviews 3 (2) 021303 (2016)
https://doi.org/10.1063/1.4953034

High-Performance Flexible Tin-Zinc-Oxide Thin-Film Transistors Fabricated on Plastic Substrates

Dedong Han, Zhuofa Chen, Yingying Cong, et al.
IEEE Transactions on Electron Devices 1 (2016)
https://doi.org/10.1109/TED.2016.2582524

P‐19: Effect of Strain on Characteristics of Amorphous In‐Ga‐Zn‐O TFTs Fabricated on Engineered Aluminum Substrates

Forough Mahmoudabadi, Miltiadis Hatalis, Kirit N. Shah and Thomas L. Levendusky
SID Symposium Digest of Technical Papers 46 (1) 1188 (2015)
https://doi.org/10.1002/sdtp.10053

Ellipsometry study of process deposition of amorphous Indium Gallium Zinc Oxide sputtered thin films

C. Talagrand, X. Boddaert, D.G. Selmeczi, C. Defranoux and P. Collot
Thin Solid Films 590 134 (2015)
https://doi.org/10.1016/j.tsf.2015.07.059

Amorphous IGZO TFTs and circuits on conformable aluminum substrates

Forough Mahmoudabadi, Xiaoxiao Ma, Miltiadis K. Hatalis, Kirit N. Shah and Thomas L. Levendusky
Solid-State Electronics 101 57 (2014)
https://doi.org/10.1016/j.sse.2014.06.031

The influence of bending on the performance of flexible carbon black/polymer composite gas sensors

Thomas Kinkeldei, Christoph Zysset, Niko Münzenrieder and Gerhard Tröster
Journal of Polymer Science Part B: Polymer Physics 51 (5) 329 (2013)
https://doi.org/10.1002/polb.23219