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Cited article:

Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy

C. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, G. A. Schwartz, D. G. de Oteyza, A. Alegría, J. Colmenero

Eur. Phys. J. Appl. Phys., 50 1 (2010) 10501

Published online: 2010-02-26

DOI: https://doi.org/10.1051/epjap/2010010

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Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip–sample distance and dielectric constant dependence

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