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Cited article:

A Comprehensive Review of the Finite Element Modeling of Electrical Connectors Including Their Contacts

Santosh V. Angadi, Robert L. Jackson, Vijayakumar Pujar and M. R. Tushar
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 (5) 836 (2020)
https://doi.org/10.1109/TCPMT.2020.2982207

Nanoporous Copper Pattern Fabricated by Electron Beam Irradiation on Cu3N Film for SERS Application

Yun Du, Yin Yin, Jiawei Wang, Zongli Wang, Charong Li, Stefan Baunack, Libo Ma and Oliver G. Schmidt
physica status solidi (b) 256 (2) (2019)
https://doi.org/10.1002/pssb.201800378

Optical characterization of Cu3N thin film with Swanepoel method

Davoud Dorranian, Laya Dejam and Gelareh Mosayebian
Journal of Theoretical and Applied Physics 6 (1) (2012)
https://doi.org/10.1186/2251-7235-6-13

Structural and optical properties of copper nitride thin films in a reactive Ar/N2magnetron sputtering system

D. Dorranian, L. Dejam, A. H. Sari and A. Hojabri
The European Physical Journal Applied Physics 50 (2) 20503 (2010)
https://doi.org/10.1051/epjap/2010040