Issue |
Eur. Phys. J. Appl. Phys.
Volume 30, Number 3, June 2005
|
|
---|---|---|
Page(s) | 205 - 213 | |
Section | Instrumentation and Metrology | |
DOI | https://doi.org/10.1051/epjap:2005024 | |
Published online | 11 March 2005 |
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