EDP Sciences logo
Subscriber Authentication Point
Search
Menu
All issues Volume 27 / No 1-3 (July-September 2004) Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 267-270 References
Issue
Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
Page(s) 267 - 270
Section Defects in wide bandgap materials 2
DOI https://doi.org/10.1051/epjap:2004119-4
Published online 15 July 2004
  1. H. W. Kunert, S. Juillaguet, J. Camassel, J. B. Malherbe, Q. Odendaal, D. J. Brink, L. C. Prinsloo, Phys. Stat. Sol. Formula 216, 619 (1999) [Google Scholar]
  2. H. W. Kunert, T. P. Maurice, D. J. Brink, L. C. Prinsloo, J. B. Malherbe, J. Camassel, Nucl. Instrum. Methods Phys. Res. Formula 181, 286 (2001) [Google Scholar]
  3. H. W. Kunert, D. J. Brink, F. D. Auret, M. Maremane, L. C. Prinsloo, J. Barnas, B. Beaumont, P. Gibart, Mater. Sci. Eng. Formula 102, 293 (2003) [Google Scholar]
  4. G. D. Chen, M. Smith, J. Y. Lin, H. X. Liang, M. Khan, C. J. Sun, Appl. Phys. Lett. 67, 1653 (1995) [CrossRef] [Google Scholar]
  5. H. W. Kunert, Cryst. Res. Technol. 38, 366 (2003) [CrossRef] [Google Scholar]
  6. H. W. Kunert, Appl. Surf. Sci., in press [Google Scholar]
  7. J. Birman, Phys. Rev. 131, 1489 (1963) [CrossRef] [Google Scholar]
  8. A. P. Cracknell, B. L. Davies, S. C. Miller, W. F. Love, Kronecker Product Tables Vol. 1–4 (LF1/ Plenum, New York, Washington, London, 1979) [Google Scholar]
  9. S. P. S. Porto, R. S. Krishnan, J. Chem. Phys. 47, 1009 (1967) [CrossRef] [Google Scholar]
  10. B. Henderson, G. F. Imbusch, Optical Spectroscopy of Organic Solids (Formula , Oxford, 1989) [Google Scholar]
  11. T. H. Maiman, R. H. Hoskins, I. J. D. Haenens, C. K. Asawa, V. Evtuhov, Phys. Rev. 123, 1151 (1961) [CrossRef] [Google Scholar]

Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.

Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.

Initial download of the metrics may take a while.